Socket
US6848928B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2002 |
| Grant date | Feb 1, 2005 |
| Priority date | — |
| Expiry date | Nov 21, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test socket 10 of the present invention includes a base member 20, a cover member 30 which is installed on base 20 to move in reciprocal straight line movement between a first position away from the base and a second position adjacent the base and a plurality of contact members 40 that are fixed in the base and are capable of making contact with terminals 2 on a semiconductor device 1 when such device 1 is mounted on base 20. A latch member 60 is supported on base 20 in a rotatable manner to move in linkage with the movement of cover member 30. A compression member 80 is pivotably attached to a tip portion 62 of latch member 60 for pressing semiconductor part 1 onto base 20 to achieve reliable contacting between terminals 2 and contacts 40 in response to movement of cover member 30. This socket design will provide for wide area engagement between the surface of semiconductor part 1 and compression member 80 to prevent damage to the semiconductor part 1 during testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.