Focal surface and detector for opto-electronic imaging systems, manufacturing method and opto-electronic imaging system
US6849843B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 2, 2001 |
| Grant date | Feb 1, 2005 |
| Priority date | — |
| Expiry date | Aug 8, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/806
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The focal surface for an opto-electronic imaging system includes an arrangement of detectors for image recording and a detector carrier or a FPA carrier for holding the detectors. The detectors are each made of at least one solid state element that is bonded to a flexible carrier substrate. The focal surface, or the detectors, respectively, exhibits a curvature, such that a curved field of view can be recorded. In a method for manufacturing a focal surface for opto-electronic imaging systems, at least one solid state element is bonded to a flexible carrier substrate to form flexible detectors, whereby a detector carrier provides a curvature and the flexible detectors are adapted to the curvature of the detector carrier. To manufacture a detector according to the present invention, a solid state element is thinned and bonded to a flexible carrier substrate, such that it is formed in a flexible manner and can be adapted to a curvature of a field of view. An opto-electronic imaging system according to the present invention with front optics for capturing an image and a detector arrangement that is arranged in a focal surface of the front optics, in which the detector arrangement is ar…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.