Reference voltage generating device, semiconductor integrated circuit including the same, and testing device and method for semiconductor integrated circuit
US6850085B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2003 |
| Grant date | Feb 1, 2005 |
| Priority date | — |
| Expiry date | Jul 22, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A testing device for a semiconductor integrated circuit of the present invention includes a differential amplifier array module and tester which determine whether an output voltage of a liquid crystal driver LSI is at a proper level and an expected value voltage generator which generates an expected value voltage in accordance with expected value data to output it to the differential amplifier array module. The expected value voltage generator produces expected value data by interpolation in accordance with incoming expected value data fewer in number than the expected value voltage to be generated, so as to be equal in number to the expected value voltage. This makes it possible to carry out an extremely short time and highly accurate test for output voltages of a device under test (liquid crystal driver LSI).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.