Patent · US Expired

Scanning microscope and optical element

US6850358B2 · kind B2 · utility

3Cited by

6References

11Claims

0Family size

Assignee

Leica Microsystems Heidelberg GmbH · DE

Inventors

Holger Birk · Meckesheim, DE
Johann Engelhardt · Bad Schönborn, DE

Key dates

Filing date	Jul 29, 2002
Grant date	Feb 1, 2005
Priority date	—
Expiry date	Nov 9, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/0076
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A scanning microscope that defines an illumination beam path and a detection beam path, having an objective that is arranged in both the illumination beam path and the detection beam path, is disclosed. The scanning microscope is characterized by an interchangeable module that is also arranged in the illumination beam path and a detection beam path and that separates the illumination beam path and detection beam path at a fixed angular relationship to one another and comprises at least a first acoustooptical component. Also disclosed is an optical element having at least three ports.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.