Method and device for near-field measuring of non-controlled radiation
US6850851B1 · kind B1 · utility
20Cited by
7References
60Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2000 |
| Grant date | Feb 1, 2005 |
| Priority date | — |
| Expiry date | Feb 8, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/0892
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electric field emitted by an electronic equipment is measured by producing at least one radiation measurement in the radiating field of the equipment. Several sets of simultaneous near-field measurements, within a measuring surface located at a short distance from the equipment, are performed. The sets of performed measurements are processed by estimating the statistical properties of the radiated field at any point outside the measuring surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.