Optical analysis systems
US6853454B1 · kind B1 · utility
3Cited by
22References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 15, 2004 |
| Grant date | Feb 8, 2005 |
| Priority date | — |
| Expiry date | Jan 15, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6456
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for optical detection of kinetic samples. The system includes a dual set of detectors linked to a single processor. The time of signal integration is different for each detector, allowing one detector to have a higher sensitivity by integrating over a longer time period while the second detector using shorter integration periods is able to measure kinetic events.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.