Apparatus and methods for fourier spectral analysis in a scanning spot microscope
US6853455B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 1999 |
| Grant date | Feb 8, 2005 |
| Priority date | — |
| Expiry date | Apr 1, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B5/3083
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A scanning spot microscope for performing a Fourier spectral analysis has means for performing a repeatable scanning operation which includes scanning an incident light spot to successive locations of a specimen. An interferometer is placed across an optical light path of the microscope, the interferometer including a birefringent device between polarizing devices in the path and introducing a given path difference. Means are provided for receiving and recording an optical signal due to the incident light spot from each successive specimen location. In use the given path difference is maintained during each scanning operation but is varied between scanning operations so that the optical signals relating to these specimen locations and the values of the given path difference can be recorded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.