Systems and methods for non-destructively detecting material abnormalities beneath a coated surface
US6853926B2 · kind B2 · utility
18Cited by
4References
27Claims
0Family size
Assignees
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Key dates
| Filing date | Jun 5, 2003 |
| Grant date | Feb 8, 2005 |
| Priority date | — |
| Expiry date | Jun 5, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8918
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides systems and methods for non-destructively detecting material abnormalities beneath a coated surface, comprising a mid-infrared (MIR) detection unit for illuminating an area of the coated surface and detecting light reflected from the illuminated area of the coated surface, and a processing unit for producing an image from optical characteristics received from the MIR detection unit. In addition, the system may further comprise a scanning unit for moving the MIR detection unit to a next area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.