Patent · US Expired

Method of and apparatus for measuring planarity of strip, especially metal strip

US6853927B2 · kind B2 · utility

5Cited by
9References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 17, 2003
Grant dateFeb 8, 2005
Priority date
Expiry dateMay 1, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0282
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring planarity of strip in a strip-rolling line or a strip-processing line in which a measuring beam, a plurality of measuring beams or discrete measuring pins in an inclined pattern across a measuring roller, measures the tension forces acting upon the strip to form a force summation foundation across the strip width. A tension distribution function is derived from the force summation function by taking derivatives of the force-summation function with respect to the width dimension of the strip and, if desired, dividing that derivative by the thickness of the strip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.