Method of and apparatus for measuring planarity of strip, especially metal strip
US6853927B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 2003 |
| Grant date | Feb 8, 2005 |
| Priority date | — |
| Expiry date | May 1, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0282
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring planarity of strip in a strip-rolling line or a strip-processing line in which a measuring beam, a plurality of measuring beams or discrete measuring pins in an inclined pattern across a measuring roller, measures the tension forces acting upon the strip to form a force summation foundation across the strip width. A tension distribution function is derived from the force summation function by taking derivatives of the force-summation function with respect to the width dimension of the strip and, if desired, dividing that derivative by the thickness of the strip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.