Patent · US Expired

Semiconductor device and method of manufacturing semiconductor device

US6856023B2 · kind B2 · utility

76Cited by
11References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 22, 2003
Grant dateFeb 15, 2005
Priority date
Expiry dateJan 22, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/12044
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The semiconductor device of the present invention comprises a substrate; at least one through hole formed through the substrate between front and back surfaces of the substrate; an electrical connection portion formed by a semiconductor process on at least one surface of the front and back surfaces of the substrate in a vicinity of an end opening of the through hole; an insulating layer formed of an organic material on an inside surface of the through hole; and an electroconductive layer formed on an inside surface of the insulating layer, wherein the electrical connection portion is electrically connected to the electroconductive layer to be electrically connected to a side of the other surface of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.