Display and method for repairing defects thereof
US6856374B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 27, 2000 |
| Grant date | Feb 15, 2005 |
| Priority date | — |
| Expiry date | Jul 27, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/136263
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
It is an object of the invention to provide a display and a method for repairing defects of the same in which defects such as inter-layer short-circuits and short-circuits in a single that have occurred at steps for manufacturing the display can be easily repaired to provide a good product with a probability higher than that in the related art. Laser irradiation is carried out as a first cycle of laser irradiation by forming a slit S1 in a region where a drain bus line 220 completely covers a gate bus line 218 to form a cut portion longer than the width of the gate bus line 218 adjacent to an inter-layer short-circuit 290 such that it splits an intersecting portion of the drain bus line 220 into two parts as shown in FIG. 5b. Next, as shown in FIG. 5c, slits S2 and S3 are respectively used for second and third cycles of laser irradiation to cut the drain bus line 220 at both ends of the cut portion (indicated by S1), thereby isolating the inter-layer short-circuit 290 of the drain bus line 220.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.