Method to characterize material using mathematical propagation models and ultrasonic signal
US6856918B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2001 |
| Grant date | Feb 15, 2005 |
| Priority date | — |
| Expiry date | Nov 26, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/4418
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is directed to a system and method for detecting defects in a manufactured object. These defects may include flaws, delaminations, voids, fractures, fissures, or cracks, among others. The system utilizes an ultrasound measurement system, a signal analyzer and an expected result. The signal analyzer compares the signal from the measurement system to the expected result. The analysis may detect a defect or measure an attribute of the manufactured object. Further, the analysis may be displayed or represented. In addition, the expected result may be generated from a model such as a wave propagation model. One embodiment of the invention is a laser ultrasound detection system in which a laser is used to generate an ultrasonic signal. The signal analyzer compares the measured ultrasonic signal to an expected result. This expected result is generated from a wave propagation model. The analysis is then displayed on a monitor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.