Probe pin array for socket testing
US6859055B2 · kind B2 · utility
2Cited by
8References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 13, 2001 |
| Grant date | Feb 22, 2005 |
| Priority date | — |
| Expiry date | Sep 18, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0408
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention includes an assembly for testing a socket. The assembly includes a plurality for probe pins extending from a housing. The housing includes a chamfered alignment guide for aligning the probe pins with openings in the socket.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.