Platen for automatic sampler
US6859271B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 2, 2001 |
| Grant date | Feb 22, 2005 |
| Priority date | — |
| Expiry date | Nov 17, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/0493
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a platen to be used with a sample tray of an automatic sampler. According to an aspect, the platen includes both electrically conductive and reflective areas that can be used to calibrate the sample tray. According to another aspect, calibration of the sample tray can be performed in all three dimensions. According to another aspect, the platen is used to calibrate the sample tray, including its height and the location of its wells. The platen may include electrically-responsive (i.e., conductive) and optically-responsive (i.e., reflective) areas that can be sensed by electrical sensors and optical sensors in order to compute the coordinates of representative wells.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.