Patent · US Expired

Method of analyzing fringe image having separate regions

US6859566B2 · kind B2 · utility

2Cited by
10References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 3, 2001
Grant dateFeb 22, 2005
Priority date
Expiry dateSep 4, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T7/521
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a method of analyzing a fringe image, a mask is provided to a gap for separating a plurality of fringe image regions from each other, a virtual fringe distribution is once rendered to the mask region so as to yield a single fringe image, a fringe analysis is carried out thereafter, and then data of the mask region is deleted, so that the separated independent regions have a phase relationship therebetween, whereby information of the object to be observed is obtained at a high speed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.