Patent · US Expired

Method of making multilevel MEMS structures

US6861363B2 · kind B2 · utility

8Cited by
5References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 2, 2002
Grant dateMar 1, 2005
Priority date
Expiry dateJan 31, 2023

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C1/00626
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

Multi-levels are etched into silicon. The levels are etched through a combination of crosslinking photoresist, multiple photoresist patterning and development, wet etching and/or dry-etching. RIE, DRIE, and other etch techniques can be used during different steps. The multilevel structure may thereby be produced at commercially acceptable production rates allowing the method of the present application to be used in volume production of multilevel structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.