Automated banding defect analysis and repair for document processing systems

US6862414B2 · kind B2 · utility

Assignee

• Xerox Corporation · US

Inventors

• Meera Sampath · Penfield, US
• Ronald M. Rockwell · Rochester, US
• D. Rene Rasmussen · Pittsford, US
• Ashok V. Godambe · Pittsford, US
• Eric Jackson · Webster, US
• Raj Minhas · Webster, US

Key dates

• Filing date: Jan 30, 2002
• Grant date: Mar 1, 2005
• Expiry date: Aug 16, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G03G15/55
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

Using a system of computer modules operatively associated with a document processing machine, banding defect analysis is accomplished by analyzing specific test patterns via image processing. The banding defects are characterized in terms of quantitative parameters based on an analysis of the banding defect. Key features are extracted from the banding defect parameters. The key features are analyzed in a diagnostic engine, to determine the possible source of the defect. The identified source is correlated to a recommended repair service procedure. The diagnostic process may be augmented by also including machine data in the analysis.