Patent · US Expired

Methods and apparatuses for measuring diversity in combinatorial structures

US6862559B1 · kind B1 · utility

22Cited by
16References
24Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 23, 1999
Grant dateMar 1, 2005
Priority date
Expiry dateJul 23, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99943
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for computing a diversity measure H(m) for combinatorial structures involves identifying all M possible substructures having m elements from among the n elements of the combinatorial structure. The number of the substructures that are similar to each such substructure is determined, and the frequency of each distinct substructure is calculated using the number of similar substructures and the total number of substructures M. The method uses the frequency of each distinct substructure to compute an entropy corresponding to m. By the same process described above, and entropy corresponding to m+1 is computed. The entropy corresponding to m+1 is subtracted from the entropy corresponding to m to produce the diversity measure H(m). In the preferred embodiment, similar substructures are determined by being identical or isomorphic. In an alternative embodiment, a distance function is used to compute a distance between two substructures, and only if the distance is less than a predetermined threshold are the two substructures determined to be similar. In the preferred embodiment, the entropy is computed by summing the frequency of each distinct substructure multiplied by the logari…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.