Patent · US Expired

Augmenting reality system for real-time nanomanipulation using atomic force microscopy

US6862924B2 · kind B2 · utility

22Cited by
5References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 2, 2003
Grant dateMar 8, 2005
Priority date
Expiry dateMay 2, 2023

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/855
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improved method is provided for performing nanomanipulations using an atomic force microscope. The method includes: performing a nanomanipulation operation on a sample surface using an atomic force microscope; determining force data for forces that are being applied to the tip of the cantilever during the nanomanipulation operation, where the force data is derived along at least two perpendicularly arranged axis; and updating a model which represents the topography of the sample surface using the force data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.