Patent · US Expired

Electrical test probe flexible spring tip

US6863576B2 · kind B2 · utility

14Cited by

13References

37Claims

0Family size

Assignee

LeCroy Corporation · US

Inventors

Julie A. Campbell · Beaverton, US
Lawrence Jacobs · Redwood City, US

Key dates

Filing date	Dec 13, 2001
Grant date	Mar 8, 2005
Priority date	—
Expiry date	Dec 13, 2021

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06788
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An electrical test probe tip, comprising a conductive flexible coil having a first end and a second end. The first end is for flexibly coupling with a device to be probed. The second end is attached to a connector. The connector may be an integral connection with a probing head or may be a connecting pin. Multiple test probe spring tips may be used to simultaneously probe signal and ground reference points. The present invention is also directed to a method for using the flexible spring tip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.