Patent · US Expired

Polishing pad for use in chemical-mechanical planarization of semiconductor wafers and method of making same

US6863774B2 · kind B2 · utility

1Cited by
20References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 1, 2002
Grant dateMar 8, 2005
Priority date
Expiry dateOct 24, 2022

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24D3/32
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad for use in chemical mechanical polishing of substrates that being made of fibrous matrix such as cellulose with a binder consisting of thermoset resin material, such as phenolic resin. The polishing surface is ground to form asperities. The polishing pad provides a porous structure by which polishing slurry and polishing debris during chemical mechanical polishing of substrates are stored for subsequent rinsing away, and for enhanced flow-distribution of the polishing slurry. Also disclosed is a method of making the polishing pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.