Optical inspection system employing a staring array scanner
US6864498B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 10, 2002 |
| Grant date | Mar 8, 2005 |
| Priority date | — |
| Expiry date | Jul 12, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/956
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanner system acquires images of articles using a sensor acquiring an image of a portion of an article and defining a field of view, a displacer operative to provide mutual relative displacement between the article and the sensor at a generally uniform rate of displacement, and a field of view freezer operative to provide a generally motionless image during image acquisition. The scanner system is particularly useful in the field of automated optical inspection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.