Suppressing the leakage current in an integrated circuit
US6864708B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 22, 2002 |
| Grant date | Mar 8, 2005 |
| Priority date | — |
| Expiry date | Jun 18, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K19/0016
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A semiconductor integrated circuit wherein the circuit area can be minimized, and defects can be detected reliably during a standby status while maintaining the reliability of a gate oxide film. Switching circuit 20 is provided between logic circuit 10 and source voltage Vdd supply terminal. While in an operating status, 0 V voltage is applied to the gate of transistor MP0 of switching circuit 20, and bias voltage VB equal to or slightly lower than source voltage Vdd is applied to its channel region in order to reduce the threshold voltage of transistor MP0 and increase its current driving capability. While in a standby status, a voltage equal to source voltage Vdd is applied to the gate of transistor MP0, a voltage lower than the source voltage is applied to the source, and bulk bias voltage VB equal to or higher than source voltage Vdd is applied to the channel region in order to minimize the drain current of transistor MP0, so that current path of logic circuit 10 is cut off, and the occurrence of leakage current is suppressed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.