Method of characterizing spectrometer instruments and providing calibration models to compensate for instrument variation
US6864978B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2000 |
| Grant date | Mar 8, 2005 |
| Priority date | — |
| Expiry date | Jul 7, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H50/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Spectrometer instruments are characterized by classifying their spectra into previously defined clusters. The spectra are mapped to the clusters and a classification is made based on similarity of extracted spectral features to one of the previously defined clusters. Calibration models for each cluster are provided to compensate for instrumental variation. Calibration models are provided either by transferring a master calibration to slave calibrations or by calculating a separate calibration for each cluster.A simplified method of calibration transfer maps clusters to each other, so that a calibration transferred between clusters models only the difference between the two clusters, substantially reducing the complexity of the model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.