Laser spectroscopy using a master/slave architecture
US6865196B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 2002 |
| Grant date | Mar 8, 2005 |
| Priority date | — |
| Expiry date | Apr 4, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/4006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for tuning one or more second radiant sources relative to a first radiant source may include a coupler configured to combine output signals from the first radiant source and a second radiant source to generate a heterodyne signal containing a frequency difference between the output signals from the first radiant source and the second radiant source. A photodetector may be configured to convert the heterodyne signal into an electrical signal containing the frequency difference. A spectrum analyzer may be configured to measure the frequency difference in the electrical signal and generate a precise difference value. A controller may be configured to adjust a wavelength of the second radiant source relative to that of the first radiant source based on the precise difference value. Laser spectroscopy may be performed by passing the output signals from the first radiant source and the second radiant source through a sample volume and detecting reflected or emitted radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.