Patent · US Expired

Process and device for evaluating the performance of a process control system

US6865511B2 · kind B2 · utility

126Cited by
6References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 21, 2004
Grant dateMar 8, 2005
Priority date
Expiry dateMay 21, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B23/024
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A preferred process for evaluating the performance of a process control system comprises generating a first set of data comprising a plurality of measurements of a first parameter controlled by the process control system and generating a second set of data comprising a plurality of measurements of a second parameter controlled by the process control system. A preferred process also comprises calculating a first statistical index from the first set of data using a statistical process control method, calculating a second statistical index from the second set of data using the statistical process control method, and combining the first and second statistical indices to produce a performance index representative of the performance of the process control system at controlling the first and second parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.