Patent · US Expired

Method of acquiring data from multi-element detector in infrared imaging apparatus

US6867417B2 · kind B2 · utility

0Cited by
6References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 31, 2003
Grant dateMar 15, 2005
Priority date
Expiry dateAug 6, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/3595
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

It is an object of the present invention to provide a data acquiring method in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of scanning each element of the multi-element detector in order synchronously with a sampling signal (12) generated by a reference signal (10) of an interferometer and repeating a series of scanning operations after completely scanning all the elements, thereby carrying out scan, shifting a starting point of sampling in next scan by one element from the starting point of the previous scan, thereby carrying out the same scanning, and repeating the scan at the number of times corresponding to the number of all the elements and then extracting data for each element from storing sampling data, thereby acquiring a data sequence of all the sampling points for each element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.