Patent · US Expired

Clock processing logic and method for determining clock signal characteristics in reference voltage and temperature varying environments

US6867630B1 · kind B1 · utility

5Cited by
3References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 2003
Grant dateMar 15, 2005
Priority date
Expiry dateJul 15, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C7/04
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

Clock processing logic and method for determining clock signal characteristics in reference voltage and temperature varying environments are described. A sample vector is characterized by bit locations corresponding to sequentially increasing delay values so that values stored in such bit locations indicate clock signal edges where value transitions occur. In one embodiment, edge detection logic and sensitivity adjustment logic are used in determining the clock period from such a sample vector. In another embodiment, an edge filter, sample accumulation logic, and clock period and jitter processing logic are used in determining an average clock period and clock jitter from a predefined number of such sample vectors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.