Method and device for determining a similarity of measure between a first structure and at least one predetermined second structure

US6868181B1 · kind B1 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Wendelin Feiten · Neubiberg, DE
• Wolfgang Rencken · Erding, DE

Key dates

• Filing date: Jul 1, 1999
• Grant date: Mar 15, 2005
• Expiry date: Jul 1, 2019

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y02P90/02
• WIPO field: Control
• WIPO sector: Instruments

Abstract

At least one base element is defined for structures, and surroundings-related information is assigned to each of these base elements. The surroundings-related information characterizes the corresponding base element. A measure of similarity is determined for the structures, the determination being effected in a manner dependent on the base elements and also on the surroundings-related information assigned to the base elements.