Method for the extraction of image features caused by structure light using image reconstruction
US6868194B2 · kind B2 · utility
9Cited by
8References
13Claims
0Family size
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Key dates
| Filing date | Dec 19, 2001 |
| Grant date | Mar 15, 2005 |
| Priority date | — |
| Expiry date | Sep 15, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/521
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for generating, in a non-contact range finding and measurement system, a template structure representative of the surface of an observed object, and for utilizing the template structure to synthesize data points in corrupted regions of an image of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.