System and method to quantify appearance defects in molded plastic parts
US6868371B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 3, 1999 |
| Grant date | Mar 15, 2005 |
| Priority date | — |
| Expiry date | May 3, 2019 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29C45/0025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spatially-resolved spectrometer is used to measure streaking in molded sample plastic parts produced using a molding tool with various mold inserts which produce certain desired topological surface features upon these sample plastic parts. The measurements from one or more of these sample plastic parts are then provided to a computerized device which appropriately filters the data and calculates overall data shape, average peak and valley shift, and a quality number indicative of data slopes. These calculations are then used to determine an optimum set of ingredients and processing conditions to be used for the full-scale plastic part production.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.