Patent · US Expired

Methods and apparatus for measuring flexural wave and/or flexural vibration using a magnetostrictive sensor

US6868730B2 · kind B2 · utility

3Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 29, 2003
Grant dateMar 22, 2005
Priority date
Expiry dateMay 29, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01H11/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is an apparatus or a method for measuring flexural waves and/or vibrations acting on ferromagnetic materials or ferromagnetic films. The present invention includes a bias magnet disposed around the ferromagnetic material so as to form a magnetic field in accordance with a stress distribution pattern occurring as the flexural wave propagates along the above said ferromagnetic material, and a measuring device for measuring the time-varying change of the magnetic induction resulting from the propagation of flexural waves on the ferromagnetic material. In addition to the above components, the bias yoke can be disposed around the ferromagnetic material to support the function of the magnet and the formation of the magnetic circuit as a measuring device for the change of the magnetic induction. In addition, a fixed electromagnet can be used as the bias magnet.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.