Analytical instrument for measurement of isotopes at low concentration and methods for using the same
US6870153B2 · kind B2 · utility
2Cited by
10References
72Claims
0Family size
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Key dates
| Filing date | Nov 19, 2003 |
| Grant date | Mar 22, 2005 |
| Priority date | — |
| Expiry date | Nov 19, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/105
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An inductively coupled plasma source mass spectrometer is equipped with a multidimensional detector system wherein ions transmitted by the mass spectrometer are detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.