Patent · US Expired

Shadow-creating depression for establishing microchip location during visual inspection

US6870177B2 · kind B2 · utility

0Cited by
5References
44Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 14, 2002
Grant dateMar 22, 2005
Priority date
Expiry dateFeb 12, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/01
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for accurately locating a micro-electronic chip in a chip-holding cavity for visual testing, the chip having at least a front wall and a pair of opposed, spaced-apart side walls, wherein the front wall meets with each of the side walls to form opposed, spaced-apart first and second front edges, comprising a cavity side wall formed to juxtapositionally abut at least one of the side walls of the chip, the cavity side wall having formed therein a depression creating a shadow projecting forward from the depression, wherein the first front edge of the chip forms a border of the shadow to form an objectively measurable contrast in grayness between the shadow and the chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.