Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor
US6870357B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 21, 2002 |
| Grant date | Mar 22, 2005 |
| Priority date | — |
| Expiry date | Mar 17, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and system for periodically measuring the junction temperature of a semiconductor device. The junction exited by at least two sequential predetermined currents of different magnitudes the voltage response of the junction to the at least two currents is measured and the temperature of the junction is calculated, while substantially canceling ohmic effects, by using the voltage response and a correction factor obtained by periodically. Whenever desired, the junction is exited by a set of at least four sequential different currents having known ratios. The voltage response to the set is measured and the correction factor is calculated by using each voltage response to the set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.