Method and apparatus for examining plasma display panel electrodes using frequency characteristics
US6870371B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 25, 2003 |
| Grant date | Mar 22, 2005 |
| Priority date | — |
| Expiry date | Jun 25, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention relates to a method and apparatus for examining Plasma Display Panel (PDP) electrodes using frequency characteristics, which can rapidly examine the PDP electrodes for defects and detect the positions thereof using frequency characteristics of signals passing through the PDP electrodes in the PDP. In the present invention, a ground plane is formed so that it does not directly come into contact with a plurality of target electrodes, and a transmission line is added to come into contact with one of the ends of the plural target electrodes. Thereafter, an examination signal having a plurality of different frequency signals which linearly vary is applied to one end of the transmission line. Peak values according to frequencies of an output signal output from the other end of the transmission line are detected and the detected output wave characteristics are analyzed, thus determining whether defects of the PDP electrodes exist.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.