Dual beam spectrophotometer modular sample system
US6870615B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Mar 17, 2003 |
| Grant date | Mar 22, 2005 |
| Priority date | — |
| Expiry date | Jul 10, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A modular dual-beam source, sample compartment and beam-combining system are provided when used with a monochromator and detector to form a spectrophotometer consisting of: (a) a source module where two ellipsoidal mirrors each produce an image of the light source, and (b) a reflecting sample-compartment module, wherein each side has two plane-mirrors, of the four plane mirrors, three are reference and one is the sample, or (c) a transmission sample-compartment module, wherein each side has two plane-mirrors, and a sample is placed between one pair of plane-mirrors, and (d) a beam-combining module wherein the source images are imaged by a second pair of ellipsoidal mirrors on a reflective chopper that combines the images at a single location that is imaged, external to the module, by another mirror, each module being kinematically located with respect to each other so the system remains optically aligned as modules are interchanged.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.