System and method for determining capacitance for large-scale integrated circuits
US6871167B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 26, 1999 |
| Grant date | Mar 22, 2005 |
| Priority date | — |
| Expiry date | Oct 26, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
For use in an integral equation formulation of capacitance, a system for, and method of, generating a representation of charge distribution for a given capacitive structure (which may be an integrated circuit). In one embodiment, the system includes: (1) a charge variation function generator that creates a multidimensional charge variation function that is not directly dependent on a conductive geometry of the structure and (2) a conductive geometry generator, associated with the charge variation generator, that creates a conductive geometry that is independent of charge variation in the structure, the charge variation function and the conductive geometry employable in the integral equation formulation to reduce a complexity thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.