Near-field probe for use in scanning system
US6873165B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2003 |
| Grant date | Mar 29, 2005 |
| Priority date | — |
| Expiry date | Apr 24, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A near electric-field probe is driven by a short laser pulse delayed through an optical delay-line for detecting vectors of near-field components of electrical signals propagating through a device under test including an electrical device or an electronic circuit based on a sampling principle. The near-field probe includes a photoconductive switch assembly including a thin semiconductor photoconductive body, at least two separated switch electrodes formed on the thin semiconductor photoconductive body, and an electrode gap formed between the two separated switch electrodes; and an optical waveguide attached to one side of the photoconductive switch assembly by using an optical adhesive, wherein the optical waveguide is partially coated with conductive material on the outer surface thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.