Patent · US Expired

Embedded cell loopback method and system for testing in ATM networks

US6873598B2 · kind B2 · utility

3Cited by
5References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 6, 2002
Grant dateMar 29, 2005
Priority date
Expiry dateMar 6, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L2012/5628
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a method and apparatus for testing components in ATM networks utilizing loop-back based ATM layer testing. The method and apparatus utilize interfaces and identifier codes to send and loop-back test cells along portions of virtual channels to test the virtual channels.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.