Spectral characteristic measuring apparatus and method for correcting wavelength shift of spectral sensitivity in the apparatus
US6876448B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 12, 2002 |
| Grant date | Apr 5, 2005 |
| Priority date | — |
| Expiry date | Apr 29, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectral characteristic measuring apparatus is provided with a memory and a CPU. The memory stores a spectral profile output from a sample light sensor array when light from a lamp is received, and a plurality of spectral profiles to be output from the sensor array at each displaced position in the case where a light separator is displaced relative to a grating member of the sensor array at a certain pitch stepwise in a wavelength diffusing direction. The CPU controls the lamp to emit light in a state that a white plate for calibration is disposed as a sample, compares a spectral profile output from the sensor array for correction with each spectral profile stored in the memory, and sets a displacement amount corresponding to the spectral profile that is most approximate to the corrective spectral profile as a wavelength shift correction amount.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.