Patent · US Expired

Technique to assess timing delay by use of layout quality analyzer comparison

US6877147B2 · kind B2 · utility

1Cited by
4References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 22, 2002
Grant dateApr 5, 2005
Priority date
Expiry dateJul 22, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/394
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In one embodiment, a computer readable medium comprises at least first instructions and second instructions. The first instructions, when executed, compute a first plurality of routes. Each route of the first plurality of routes corresponds to a respective net of a plurality of nets in an integrated circuit layout, and represents a theoretically optimal route of the respective net according to a graph theory based algorithm. The second instructions, when executed, compare each of the first plurality of routes to a corresponding route of a current plurality of routes, each of the current plurality of routes corresponding to the respective net of the plurality of nets and currently existing in the integrated circuit layout. A method is also contemplated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.