Optical waveguide monitoring
US6879386B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 2002 |
| Grant date | Apr 12, 2005 |
| Priority date | — |
| Expiry date | May 17, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/4479
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques for monitoring the quality (e.g., optical and mechanical properties) in optical waveguides (e.g., photonic crystal fibers) are disclosed. Additionally, techniques for detecting and localizing defects in the waveguides are also described. Pulses of light are launched into one end of an optical waveguide. The amount of light scattered out of the same end of the waveguide (i.e., a backscattered or reflected signal) is monitored at certain wavelengths specific to the spectral characteristics of the waveguide. Transmission characteristics and defect localization can be determined from the backscattered signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.