Patent · US Expired

Optical waveguide monitoring

US6879386B2 · kind B2 · utility

27Cited by
15References
67Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 7, 2002
Grant dateApr 12, 2005
Priority date
Expiry dateMay 17, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/4479
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Techniques for monitoring the quality (e.g., optical and mechanical properties) in optical waveguides (e.g., photonic crystal fibers) are disclosed. Additionally, techniques for detecting and localizing defects in the waveguides are also described. Pulses of light are launched into one end of an optical waveguide. The amount of light scattered out of the same end of the waveguide (i.e., a backscattered or reflected signal) is monitored at certain wavelengths specific to the spectral characteristics of the waveguide. Transmission characteristics and defect localization can be determined from the backscattered signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.