Polarization dependent return loss measurement
US6879387B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 4, 2003 |
| Grant date | Apr 12, 2005 |
| Priority date | — |
| Expiry date | Apr 6, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3181
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.