Patent · US Expired

Polarization dependent return loss measurement

US6879387B2 · kind B2 · utility

1Cited by
2References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 4, 2003
Grant dateApr 12, 2005
Priority date
Expiry dateApr 6, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/3181
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to an apparatus and to a method of optical characterization of a DUT by measurement of its optical return loss, comprising the steps of: providing an incident polarized optical signal to the DUT, detecting a reflected power of a reflected optical signal reflected by the DUT as a function of the polarization of the incident optical signal, and evaluating the optical return loss of the DUT as a function of the polarization of the incident optical signal on the basis of the detected reflected power.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.