Measurement system software architecture for easily creating high-performance measurement applications
US6879926B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2001 |
| Grant date | Apr 12, 2005 |
| Priority date | — |
| Expiry date | Apr 22, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/2656
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
System and method for creating measurement applications. The system includes a measurement task specifier for generating a measurement task specification (MTS) for a measurement task in response to user input; an expert system for analyzing and validating the generated MTS, and generating a run-time specification (RTS) for the measurement task; a run-time builder for analyzing the RTS, configuring one or more measurement devices according to the RTS, and generating a run-time which is executable to perform the measurement task. The system includes a storage system for storing the generated MTS, the generated RTS, and configuration information for one or more measurement devices. The expert system includes one or more measurement experts which analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.