Patent · US Expired

Functional element test tool and method

US6880109B2 · kind B2 · utility

2Cited by
14References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 3, 2001
Grant dateApr 12, 2005
Priority date
Expiry dateFeb 6, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3688
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and system are provided by the present invention for testing performance validity and accuracy of functional elements of a computer application. A stand-alone test tool provides an environment in which the operation of the functional element can be monitored along with a plurality of interfaces between the functional element and the computer application. The test tool permits creation of a test data file which can be viewed and edited as desired outside of the test tool environment, and permits creation of a test case generation file with the user assisted by prompts as to interface task options. In a preferred embodiment a test cooperates with an interface protocol of a type involving a memory shared by multiple functional elements and employing a mode of notifying an addressed functional element that data is ready and of specifying the location of the data in the shared memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.