System for testing multiple devices on a single system and method thereof
US6880116B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2001 |
| Grant date | Apr 12, 2005 |
| Priority date | — |
| Expiry date | Jan 3, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31926
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for testing multiple components using a single host system is shown and described. A host system with a single advanced graphics port (AGP) is used to generate commands of a test routine to test a particular type of AGP processing component. A test fixture interfaces to the AGP port of the host system and provides the commands to each of a plurality of test components. The test components process the commands concurrently, generating results. The test fixture receives each of the results in turn and provides the results to the host system, allowing the host system to determine if the test components are functioning within particular parameters. The test fixture provides an interface to allow several test components to be tested as AGP master devices, over a single AGP port on the host system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.