Patent · US Expired

Method and apparatus for performing dynamic mechanical analyses

US6880385B2 · kind B2 · utility

4Cited by
6References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 2, 2003
Grant dateApr 19, 2005
Priority date
Expiry dateApr 2, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0226
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a dynamic mechanical analysis, a test specimen is coupled to an excitation device by a holder device. An excitation force made up of a static pre-tensioning force component and a time-variable force component is applied to the test specimen, and a deformation of the test specimen is measured by one or more displacement sensors. In a test phase an excitation force is applied to the test specimen, while at least one decision parameter is determined. The decision parameter is indicative of a degree of slack in the coupling of the test specimen. Based on the comparison between the decision parameter and at least one reference value it is determined whether or not the test specimen is coupled to the excitation device in a completely slack-free state, so that any measured physical values will not be subjected to errors caused by an insufficient amount of the pre-tensioning force.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.