Patent · US Expired

Method and system for inspecting optical devices

US6882411B2 · kind B2 · utility

13Cited by
6References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 21, 2003
Grant dateApr 19, 2005
Priority date
Expiry dateMar 31, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/0214
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention includes methods and apparatuses for inspecting optical devices, particularly contact lenses.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.