Patent · US Expired

Frequency transform phase shifting interferometry

US6882432B2 · kind B2 · utility

140Cited by
4References
34Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 31, 2001
Grant dateApr 19, 2005
Priority date
Expiry dateJul 31, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/70
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention features methods and systems in which wavelength-tune PSI data is analyzed in the frequency domain to produce spectrally separated frequency peaks each corresponding to a particular pair of surfaces in an interferometric cavity defined by multiple pairs of surfaces. Each frequency peak provides optical path length information about a corresponding pair of surfaces in the cavity. As a result, the interferometric data from such cavities provides simultaneous information about multiple surfaces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.